吉時利 4200A-SCS 參數分析儀

使用 4200A-SCS 加速半導體裝置、材料和製程開發的研究、可靠性和故障分析研究。 最高效能參數分析儀,其可提供同步電流-電壓 (I-V)、電容-電壓 (C-V),以及超快速脈衝 I-V 量測。

在您的個人電腦上免費試用

Product-series_4200-promo-options

直流電流-電壓
(I-V) 範圍

10 aA - 1A
0.2 µV – 210 V

電容-電壓
(C-V) 範圍

1 kHz - 10 MHz
± 30V 直流偏壓器

脈衝 I-V
範圍

±40 V (80 V p-p),±800 mA
200 MSa/秒,5 ns 取樣率

 

吉時利 4200A-SCS 參數分析儀

透過參數提供深入的洞察資訊,快速且清楚。

正在執行 CV 掃描的 4200A-SCS 和 4200A-CVIV 正面圖

聯繫您的大膽探索從未如此輕鬆。 4200A-SCS 參數分析儀可將特性複雜度和測試設定減少高達 50%,因而提供清楚、不妥協的量測和分析功能。 此外,業界首見的嵌入式量測專門知識可提供測試指引,並讓您對結果有無比信心。

特性

  • 內建英文、中文、日文和韓文的量測視訊
  • 使用數百個使用者可修改的應用測試立即開始您的測試
  • 自動化的即時參數擷取、資料蒐集、算術函數

量測。 切換。 重複。

晶圓探針台上的 Keithley 4200A-CVIV 多重切換

4200A-CVIV 多切換模組可自動切換 I-V 和 C-V 量測,不需重新架設纜線或提起適當的探棒頭。 不同於競爭產品,四通道 4200A-CVIV 顯示器提供本機視覺化見解,可在發生非預期結果時進行快速測試設定和輕鬆的疑難排解。

特性

  • 將 C-V 量測移至任何裝置終端,不需重新架設纜線
  • 使用者可針對低電流功能進行配置
  • 個人化輸出通道的名稱
  • 檢視即時測試狀態

I-V 特性的穩定低電流量測

4201-SMU 和 4211-SMU 模組讓您在高電容系統,達到穩定的低電流量測。4200A-SCS 共有四個精密電源/量測設備 (SMU) 模組可供選擇,您可以進行自訂以符合所有 I-V 量測需求。KEITHLEY 提供可現場安裝的裝置及可選用的前置放大器模組,確保您能夠在幾乎不會停機的情況下,進行最準確的低電流量測。

特性

  • 無須將儀器送回原廠,即可新增 SMU
  • 進行微微安培量測
  • 最高 9 個 SMU 通道
  • 針對長纜線或大卡盤進行最佳化

具備分析探棒和低溫控制器的整合解決方案。

晶圓探針台前方的 Keithley 4200A-SCS 參數分析儀

4200A-SCS 參數分析儀支援許多手動和半自動晶片探棒和低溫控制器,包括 MPI Cascade MicroTech、Lucas Labs/Signatone、MicroManipulator、Wentworth Laboratories、LakeShore Model 336 低溫控制器。

特性

  • 「點按」測試順序
  • 「手動」探棒模式測試探棒功能
  • 假探棒模式可啟用除錯,而不會移除指令

減少成本並保護投資

採用 KEITHLEY 服務方案保護您的投資

Keithley Care 方案只要按需求服務的一小部分成本,就可以提供快速、高品質的服務。 只要點選一下或一通電話即可取得維修涵蓋範圍 – 免報價單、採購單或核准造成的延遲。

深入瞭解

 

產品規格表 機型 說明 定價
檢視產品規格表 4200A-SCS-PK1
高解析度 IV
210V/100mA,0.1 fA 解析度
適用於兩終端與三終端裝置、MOSFET、CMOS 特性套裝 4200A-SCS-PK1 包括:
  • 4200A-SCS 參數分析儀
  • (2) 4200-SMU 模組
  • (1) 4200-PA 前置放大器
  • (1) 8101-PIV 測試治具 (具備採取裝置)
索取報價
檢視產品規格表 4200A-SCS-PK2
高解析度 IV & CV
210V/100mA,0.1 fA 解析度、1kHz - 10MHz
適用於高 κ 電介質、深次微米 CMOS 特性套裝 4200A-SCS-PK2 包括:
  • 4200A-SCS 參數分析儀
  • (2) 4200-SMU 模組
  • (1) 4200-PA 前置放大器
  • (1) 4210-CVU 電容-電壓模組
  • (1) 8101-PIV 測試治具 (具備採取裝置)
索取報價
檢視產品規格表 4200A-SCS-PK3
高解析度及功率 IV 與 CV
210V/1A,0.1 fA 解析度、1kHz - 10MHz
適用於電力裝置,高 κ 電介質,深次微米 CMOS 裝置特性套件 4200A-SCS-PK3 包括:
  • 4200A-SCS 參數分析儀
  • (2) 4200-SMU 模組
  • (2) 4210-SMU
  • (2) 4200-PA 前置放大器
  • (1) 4210-CVU 電容-電壓模組
  • (1) 8101-PIV 測試治具 (具備採取裝置)
索取報價
檢視產品規格表 4200-BTI-A
超快速 NBTI/PBTI
適用於以先進的矽 CMOS 技術進行精密的 NBTI 與 PBTI 量測套件 4200-BTI-A 包括:
  • (1) 4225-PMU 超快速 I-V 模組
  • (2) 4225-RPM 遠端前置放大器/開關模組
  • 自動化特性分析套件 (ACS) 軟體
  • 超快速 BTI 測試專案模組
  • 纜線
索取報價

半導體可靠度

以可靠的 4225-PMU 脈波模組執行可靠度測試

執行複雜的可靠度測試,同時讓 4200A-SCS 處理複雜性。包括熱載波注入衰減 (HCI) 和負極偏壓溫度不穩定 (NBTI) 等的專案讓您搶先開始使用裝置分析。針對較大型的實驗室,4200-BTI 套件包括使用 KEITHLEY 的 ACS 軟體進行映射和全自動探棒控制。

特性

  • 在一組測試中結合 DC I-V、C-V 及脈波量測
  • 已包含許多探測站及外部儀器的支援
  • 簡單易用的循環系統允許無須編碼即可重複量測

高阻抗應用解決方案的 C-V 量測

在 MOSCAP 裝置上執行極低頻 C-V 掃描

使用 Keithley 的自訂超低頻 C-V 技術來分析高電阻取樣的電容。 此技術的執行方式是僅使用電源量測單元 (SMU) 儀器,但也可與 4210-CVU 結合來執行更高的頻率量測。

特性

  • 頻率範圍 .01 至 10 Hz,靈敏度 1 pF 至 10 nF
  • 3 位半典型解析度,最小典型 10 fF

固定式記憶體

以可靠的 4225-PMU 脈波模組執行 PUND 記憶體測試順序

將您的新技術放入測試,並搭配完整的脈波 I-V 特性。 4200A-SCS 隨附 NVRAM 技術最新功能的支援和隨即執行測試,從浮接閘道快閃到 ReRAM 和 FeRAM。 電壓與電流中的雙來源及量測功能可同時允許暫態和 I-V 域特性。

使用長纜線或電容治具進行測試

以 4201-SMU 模組執行 Vg-Id 測試

使用 4201 或 4211-SMU 作測試時,需要很長的纜線和較高電容的治具。對於連接 LCD 測試台、探棒、開關矩陣或任何其他大型或複雜至測試儀,這些 SMU 最為理想。可現場安裝的版本讓您無須將裝置送回服務中心,即可增加容量。

奈米裝置特性

奈米碳管 FET 系列曲線

4200A-SCS 的整合式儀器功能可簡化開發奈米電子的量測需要,例如奈米碳管。 從預先配置的測試專案開始進行調查,並從這裡延伸您的工作。 SMU 的脈衝來源模式可協助降低過熱問題,可在幾秒內與低壓 C-V 和超快速脈衝 DC 量測結合。

材料的電阻率

使用共線性四點探棒執行材料科學的電阻率量測

使用 4200A-SCS 搭配整合式 SMU 可輕鬆使用四點共線性探棒或 van der Pauw 方法來量測電阻率。 包含的測試會自動執行重複 van der Pauw 計算,為您節省寶貴的研究時間。 10aA 的最大電流解析度和 >10­­­­16 OHM 的輸入阻抗能為您提供更精確且精準的結果。

MOSFET 特性

4200A-SCS 參數分析儀上進行的 MOSFET 臨界值電壓量測

4200A-SCS 可以透過元件或晶片上測試保留 MOS 裝置的完整特性的必要儀器。 包含的測試和專案會解決 MOSCap 的二極體厚度、臨界值電壓、摻雜濃度、流動離子濃度等等。 這些測試全都可以從單一儀器盒觸碰按鈕來加以執行。

產品規格表 模組 說明 配置與報價
4200A-CVIV I-V/C-V 多重切換模組 配置和報價
4201-SMU 高電容設定適用的中功率電源量測單元 配置和報價
4211-SMU 高電容設定適用的高功率電源量測單元 配置和報價
4201-SMU-R 高電容設定適用的可現場安裝中功率電源量測單元 配置和報價
4211-SMU-R 高電容設定適用的可現場安裝高功率電源量測單元 配置和報價
4200-SMU 中功率電源量測單元 配置和報價
4210-SMU 高功率電源量測單元 配置和報價
4200-SMU-R 可在現場替換的 MPSMU 配置和報價
4210-SMU-R 可在現場替換的 HPSMU 配置和報價
4200-PA 遠端前置放大器模組 配置和報價
4210-CVU 電容-電壓單位 配置和報價
4220-PGU 高壓脈衝波產生器單元 配置和報價
4225-PMU 超快速脈衝量測單元 配置和報價
4225-RPM 遠端前置放大器/切換模組 配置和報價
4200-BTI-A 超快速 BTI 封包 配置和報價
Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200
Introduction Maintaining the quality and reliability of gate oxides is one of the most critical and challenging tasks in any semiconductor fab. With feature sizes shrinking to 0.18µm or less, gate oxides are often less than 30Å …

文件編號: #2239
應用摘要
Measuring Inductance Using the 4200-CVU Capacitance-Voltage Unit
應用摘要
Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.

文件編號: 1KW-61388-0
應用摘要
What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements.  However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below …
常見問答集 ID469646
Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek …
常見問答集 ID248681
Do I need to calibrate my instruments separately when I upgrade from the 4200-SCS to a 4200A-SCS mainframe?
No; when the 4200A-MF-UP service is selected, the 4200-SCS is converted to the 4200A-SCS mainframe. This system gains the Clarius software. All supported instrument modules in the original system will be moved to the new, 4200A-SCS mainframe and will …
常見問答集 ID780926
Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software.  The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200 are compatible with the 4200A. Note: ICCAP only …
常見問答集 ID255351
I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3
常見問答集 ID247546
What is included in the 4200A-SCS Windows 10 Upgrade option?
The 4200A-SCS can be upgraded from the Windows 7 operating system to Windows 10. The part number for this upgrade is 4200A-WIN10-UP. This service will provide a USB flash drive containing the upgrade program files and instructions for installing the …
常見問答集 ID780921
Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software).
常見問答集 ID249356
4200A-SCS Parameter Analyzer Datasheet

文件編號: 1KW-60780-5
Datasheet
Model 4200A-SCS Parameter Analyzer Reference Manual

The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A-SCS.

The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A. It includes hardware information, such as connection information and SMU, PGU, PMU, and CVU descriptions. It also includes descriptions of the Clarius, KCon, KPulse, KULT, and KXCI software. LPT library descriptions are also provide. 


零件編號: 4200A-901-01G_September_2019_Reference.pdf
主要使用者
Model 4200A-SCS Clarius V1.7 Software

The Clarius+ software application suite is the software for the 4200A-SCS. Clarius+ software requires Microsoft Windows 10 on your 4200A-SCS Parameter Analyzer. These release notes describe fixed issues and known issues in the software.


零件編號: 077132609
版本資訊
Model 4200A-SCS Clarius V1.6.1 Software

The Clarius+ software application suite is the software for the 4200A-SCS. Clarius+ software requires Microsoft Windows 10 on your 4200A-SCS Parameter Analyzer. These release notes describe fixed issues and known issues in the software.


零件編號: 077132608
版本資訊
Model 4200A Parameter Analyzer User's Manual
The Keithley Instruments Model 4200A-SCS User's Manual provides detailed product, connection, accessory, application, and Clarius+ software information. User Manual

This User's Manual includes specific applications to help you get started quickly.
零件編號: 4200A-900-01C
主要使用者
Model 4200A-SCS Parameter Analyzer Reference Manual
The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A-SCS.

The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A. It includes hardware information, such as connection information and SMU, PGU, PMU, and CVU descriptions. It also includes descriptions of the Clarius, KCon, KPulse, KULT, and KXCI software. LPT library descriptions are also provided.


零件編號: 4200A-901-01F
主要使用者
Model 4200A-CVIV Multi-Switch User's Manual
User's manual for the 4200A CV-IV multi-switch.

The Keithley Instruments Model 4200A-CVIV Multi-Switch User's Manual provides detailed product, connection, accessory, application, and Clarius+ software information.


零件編號: 4200A-CVIV-900-01D
主要使用者
Model 4200A-RM Rack Mount Kit Installation Instructions
Model 4200A-RM Rack Mount Kit Installation Instructions

This document contains installation instructions for the Model 4200A-RM Rack-Mount Kit, a fixed rack-mount kit for cabinet mounting of the Keithley 4200A-SCS Semiconductor Characterization System.


零件編號: 071348701
Model 4210-MMPC-C Multi-Measurement Prober Cable Kit Quick Start Guide
This multi-measurement cable set is a collection of standard and custom connectors and accessories used to take I-V, C-V, and pulsed I-V measurements using a single prober cable setup. Instruction Manual

This multi-measurement cable set is a collection of standard and custom connectors and accessories used to take I-V, C-V, and pulsed I-V measurements using a single prober cable setup.
零件編號: PA-1001D
使用者
KTE Interactive V9.1 Service Pack 2 Software Release Notes & Installation Instructions
Release notes and installation instructions for KTE Interactive software for the 4200. Release Notes

This document provides supplemental information regarding KTE Interactive V9.1 Service Pack 2 (SP2). This information includes detailed instructions describing how to install this service pack and and summary of fixes and enhancements included in KTE Interactive V9.1 Service Pack 2.
零件編號: PA-895R
版本資訊
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions Instructions

If you have data security concerns, this document tells you how to clear or sanitize the Keithley Instruments Model 4200-SCS Semiconductor Characterization System's memory devices. It also explains how to declassify an instrument that is not functioning.
零件編號: 077134300
解除機密
Model 4200A-SCS Declassification and Security Instructions
Model 4200A-SCS Declassification and Security Instructions Instructions

If you have data security concerns, this document tells you how to clear or sanitize the Keithley Instruments Model 4200A-SCS Parameter Analyzer's memory devices. It also explains how to declassify an instrument that is not functioning.
零件編號: 077126200
解除機密
Modèle 4200A-SCS Liste d'Avertissements
Warnings from the QSGs, User's Manual and Reference Manual translated into French for the 4200A-SCS Other

List of documentation warnings for the Canadian market that are in both English and French.
零件編號: 077126000
使用者
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide Quick Start User Manual

Brief introduction to the Keithley Instruments 4200A-SCS Parameter Analyzer, including unpacking and initial connection information.
零件編號: 4200A-903-01A
主要使用者
Model 4200A-SCS Package 3 System Quick Start Guide
Model 4200A-SCS Package 3 System Quick Start Guide Quick Start User Manual

The Quick Start Guide for the Keithley Instruments 4200A-SCS-PK3 provides unpacking and basic connection information. It also provides step-by-step examples to allow you to familiarize yourself with the Parameter Analyzer.
零件編號: 4200A-PK3-903-01A
主要使用者
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide Quick Start User Manual

The Quick Start Guide for the Keithley Instruments 4200A-SCS-PK2 provides unpacking and basic connection information. It also provides sample tests that you can use to familiarize yourself with the Parameter Analyzer.
零件編號: 4200A-PK2-903-01A
主要使用者
Model 4200-Compiler Installation Instructions
4200-Compiler installation instructions for the 4200A-SCS and 4200-SCS Instructions

Installation instructions for the Model 4200-Compiler, a compiler that you can use to create user modules for the 4200A-SCS Parameter Analyzer and the 4200-SCS.
零件編號: PA-1030E
合併使用者/服務
4200A-SCS Clarius+ Software Suite V1.7
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …

零件編號: 4200A-CLARIUS-V1.7
應用
4200A-SCS Clarius+ Software Suite V1.6.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …

零件編號: 4200A-CLARIUS-V1.6.1
應用
4200A-SCS Clarius+ Software Suite V1.5
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer.If installing on a …

零件編號: 4200A-CLARIUS-V1.5
應用
4200A-SCS Clarius+ Software Suite V1.3
The 4200A-SCS Clarius+ Software Suite provides a clear, uncompromised parameter analysis for your semiconductor devices, materials, processes and more. Download the latest version of Clarius+ to stay up-to-date with the ever-growning library of ready …

零件編號: 4200A-CLARIUS-V1.3
應用
4200-SCS KTEI V9.1 Service Pack 2
4200-SCS KTE Interactive V9.1 Service Pack 2 includes all changes from KTEI V9.1 Service Pack 1, plus additional enhancements and fixes for known bugs. This service pack is to be installed on top of either KTEI V9.1 or V9.1 Service Pack 1 software on …

零件編號: 4200-KTEI-V9.1SP2
應用
Writing Prober Drivers for the Model 4200-SCS

文件編號: Job #2361. Updated 01/07
應用摘要
Probing Transistors at the Contact Level in Integrated Circuits
應用摘要
C-V Characterization of MOS Capacitors Using the Model 4200-SCS Semiconductor Characterization System
應用摘要
Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.

文件編號: 1KW-60641-1
應用摘要
C‑V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60645-0
應用摘要
C-V Testing for Semiconductor Components and Devices - Applications Guide
應用摘要
Creating External Instruments Drivers for the Model 4200-SCS

文件編號: technical note #2661
應用摘要
Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer

文件編號: 1KW-60635-0
應用摘要
Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60639-0
應用摘要
Using the 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60637-0
應用摘要
Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.

文件編號: 1KW-61356-0
應用摘要
Using the Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Using the Wafer Map Parameters Option with Cascade Nucleus Prober Software and the Model 4200-SCS

文件編號: Job number 2657.
應用摘要
Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements

文件編號: 1KW-60628-0
應用摘要
E-Handbook Guide to Switch Considerations by Signal Type
規格摘要表
Evaluating Oxide Reliability
Application Note Number 2240 Evaluating Oxide Reliability Using V-Ramp and J-Ramp Techniques Oxide integrity is an important reliability concern, especially for today's ULSI MOSFET devices, where oxide thickness has been scaled to a few atomic layers …
應用摘要
Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60633-0
應用摘要
Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60642-0
應用摘要
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Monitoring Channel Hot Carrier (CHC) Degradation of MOSFET Devices using Keithley's Model 4200-SCS

文件編號: Print job #2535
應用摘要
Model 4200-SCS Semiconductor Characterization System
Full color brochure covering the semiconductor characterization system, Model 4200-scs.
小冊子
Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test
Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.
新聞稿
Modifying Keithley Interlock Cable 236-ILC-3 for Use w/Cascade 12000 Series Semiautomatic Probers
應用摘要
Simplifying MOSFET and MOSCAP Device Characterization e-Guide
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the …

文件編號: 1KW-60780-1
小冊子
SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH

文件編號: 55W_30503_2
小冊子
An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement

文件編號: 1KW-60643-0
應用摘要
Ultra Fast Single Pulse Technique for Channel Effective Mobility Measurement
應用摘要
1 ns Pulsing Solutions for Non-Volatile Memory Testing
Ultra-fast (<10 ns) pulsing is required to develop the newest non-volatile memory types like Flash, PCRAM, STT-RAM and others. In addition to the recommended minimum and allowable minimum pulse widths possible using the Keithley 4225-PMU Ultra-Fast I …

文件編號: 1KW-61454-1
技術簡介
Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
應用摘要
Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process …

文件編號: 1KW-60873-1
規格摘要表
Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13
規格摘要表
ACS Integrated Test System for Lab-Based Automation
應用摘要
Pulsed I-V Testing for Components and Semiconductor Devices - Applications Guide
應用摘要
Pulse I-V Characterization of Non-Volatile Memory Technologies

文件編號: 1KW-60638-0
應用摘要
Pulse Testing for Nanoscale Devices
技術文章
Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process …

文件編號: 1KW-61526-0
應用摘要
Greater Reliability Testing Confidence from Lab to Fab - Wafer Level Reliability Test Solutions
Keithley Instruments has long been an industry leader in both overall parametric test technology and wafer level reliability (WLR) testing. Several generations of Keithley’s parametric test solutions have offered WLR test algorithm libraries as …
海報
Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure Instruments
規格摘要表
Making Charge-Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System and Series 3400 Pulse/Pattern Generator

文件編號: Job #2851
應用摘要
METHODS AND TECHNIQUES FOR SEMICONDUCTOR CHARACTERIZATION

文件編號: 1KW-60825-0
應用摘要
Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the …

文件編號: 1KW-61609-0
應用摘要
Making Optimal Capacitance and AC Impedance Measurements with the 4210-CVU Capacitance Voltage Unit
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications.  This application note describes how to make optimal capacitance measurements using proper measurement …

文件編號: 1KW-61528-0
應用摘要
Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.

文件編號: 1KW-61527-0
應用摘要
Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for …

文件編號: 1KW-61529-0
應用摘要
Making I-V and C-V Measurements on Solar/Photovoltaic Cells Using the Model 4200-SCS Semiconductor Characterization System
應用摘要
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS Semiconductor Characteriztion System Parametric characterization of semiconductor devices typically requires making extremely low current measurements. For MOSFET devices, the …

文件編號: Application Note Number 2241
應用摘要
Low Level Measurements Handbook - 7th Edition

文件編號: 1KW-1559-0
手冊
A Local Area Network Laboratory Based on the Keithley 4200-SCS for Engineering Education in Microelectronics
白皮書
Moving from Windows XP to Windows 7? Upgrade Your Model 4200-SCS
使用方式指南
Evaluating Hot Carrier Induced Degradation of MOSFET Devices
Application Note # 2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices With decreased MOSFET gate length, hot carrier induced degradation has become one of the most important reliability concerns.
應用摘要
Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the Mode 4200-SCS Semiconductor Characterization System
應用摘要
The Emerging Challenges of Nanotechnology Testing
技術文章
Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60644-0
應用摘要
Performing Charge Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).

文件編號: 1KW-60634-0
應用摘要
Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …

文件編號: 75W-61556-0
技術簡介
Breathe New Life into Your 4200-SCS Parameter Analyzer
規格摘要表
Optimizing Low Current Measurements with the Model 4200-SCS Semiconductor Characterization System
應用摘要
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS

文件編號: Rev 7.15.11 ah
應用摘要
KTEI V8.2 for the Model 4200-SCS: Characterize NVM, Measure VLF C-V, Make More Pulsed or Ultra-fast I-V Measurements in Parallel
小冊子
Keithley Pulse Solutions
小冊子
Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
小冊子
DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer …
應用摘要
DC Electrical Characterization of RF Power Transistors
應用摘要
How to Choose and Apply Source Measure Unit SMU Instruments
應用摘要
Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend
技術文章
Keithley Instrumentation for Electrochemical Test Methods and Applications
This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve …

文件編號: 1KW-60158-1
應用摘要
Improving the Measurement Speed and Overall Test Time of the Model 4200-SCS
應用摘要
Optimizing Low Current Measurements with the 4200A-SCS Parameter Analyzer

文件編號: 1KW-60636-0
應用摘要
I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100 Nanomanipulator

文件編號: Job #2481
應用摘要
DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for …

文件編號: 1KZ-61313-0
應用摘要
TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION

文件編號: 1KW-60826-0
應用摘要
Safely Using the Interlock on the Keithley Model 4200-SCS
應用摘要
Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe

文件編號: 1KW-60640-0
應用摘要
Keithley PreAmp Adapter Installation

Keithley PreAmp Adapter Installation Model 4200-TMB Triaxial Mounting Bracket instructions


零件編號: PA-633A
使用者
Models 4200-MAG-BASE, VAC-BASE, and 4225-RPM

Models 4200-MAG-BASE, VAC-BASE, and 4225-RPM Probe Station Mounting Base Installation Instructions
零件編號: PA-624C
使用者
TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION

文件編號: 1KW-60826-0
應用摘要
Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made. 
32m 53s
In this video, we show you how to quickly set up your test for making automatic I-V and C-V measurements on the Keithley 4200A-SCS Parameter Analyzer.
5m 31s
Get tips on improving DC I-V and capacitance voltage measurements, along with tips on performing DC pulsed tests.
26m 47s
Listen to our panel discuss three semiconductor measurement applications where shrinking sizes or faster speeds have changed the device measurement methods being used for the newest memory …
41m 41s
This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run …
27m 27s
Measuring new materials or devices? Watch how you can get insights faster-than-ever with hassle-free connections, faster test setup, and built-in test libraries and learning tools. See how to gain …
1m 37s