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400G PAM4 測試

400g-app-header

400G PAM4 測試

 

克服 400G 量測挑戰

隨著全球各地的雲端運算使用量快速成長,人們對於高效能資料中心基礎架構的需求量也大幅增加。 為了跟上此一強勁需求,開發人員無不轉為採用 400G 技術,以便實現更小型、更快速、更低每單位位元成本的解決方案。

有數種核心技術可支援 400G,包括使用更高階的調變和更高的資料速率 (最高 56 Gbaud)。 這項新的調變配置可提供四位準脈波振幅調變 (PAM4),其會在每個符號發射兩個位元,資料速率是傳統 NRZ 的兩倍。

PAM4 訊號 (具有較低的訊號訊雜比,且振幅是同等 NRZ 的 1/3) 需要更先進的工具和功能,才能成功完成驗證。

加快 400G 產品的開發速度

400G 產品很難開發。PAM4 訊號需要更先進的工具和功能,才能成功地進行評估。 DPO7OE 系列光學探棒 具有 DPO70000 即時示波器,可提供卓越的功能、觸發和除錯能力,以有效進行故障檢修和量測高達 56 GBaud 的 PAM4 訊號。

Tektronix 即時解決方案 可讓您有效率地事先驗證技術,並快速除錯和驗證可與低雜訊取樣示波器互補的 400G 技術。

NRZ-vs-PAM4

從 NRZ 轉為採用 PAM4,會增加光學訊號的測試複雜度。

更快速地進行驗證並增加產出

其中一項最大的挑戰是,既要讓每一裝置的測試成本盡可能地低,又要符合所要求的規格。 由於 PAM4 訊號所必須進行的測試次數比 NRZ 訊號多了 10 倍以上,您必須有雜訊最少、可快速提供量測以便進行最佳化調諧的解決方案,才能產生最大量的產出。

Tektronix 取樣解決方案包括 DSA8300 和 80C20/21 光學模組 ,在測試高達 56 GBaud 時可提供最高的頻寬、最高的靈敏度和最短的測試時間。本解決方案可讓您有效地在效能和測試成本之間取得平衡。

TDECQ_plot_sampling_scope

TDECQ 量測可顯示出 PAM4 訊號的測試複雜度。

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Library

Title
PAM4 in 400G/200G/100G/50G Networking Technology Poster
Download our poster and receive a complete, up-to-date poster providing an overview of PAM4, including both optical standards and measurements and electrical standards and measurements.
Optical Bandwidth Requirements for NRZ and PAM4 Signaling
Until recently, both optical and electrical bandwidths produced similar results but this is no longer the case with the recent IEEE spec change. This paper clarifies these terms, mathematically shows ...
Analyzing 26 to 53 GBd PAM4 Optical and Electrical Signals
The need to deliver data rates in excess of 50 Gb/s has created great interest in bringing next generation PAM4 components and systems to market. This paper presents techniques for analyzing 28 GBaud ...
PAM4 Signaling in High Speed Serial Technology: Test, Analysis, and Debug
Learn valuable information on testing PAM4 technology and approaches for validating PAM4 signals.  This application note describes: PAM4 technology for 50-400G applications Provides details of PAM4 ...
In this video you will learn how easy it is to recover a clock on an optical PAM4 signal and display an eye. The DPO7OE1 and DPO7OE2 is the perfect solution for optical high-speed measurement wher...
See the versatility of our high-speed optical-to-electrical converters (DPO7OE1 and DPO7OE2 Optical Probes) for 200G and 400G PAM4 measurements. Multiple high-speed acquisitions of long pattern le...
Finding the right filter settings for your optical TDECQ and NRZ measurements can be a pain on conventional solutions. With the new real-time O to E’s (DPO7OE Series) from Tektronix changing the O...
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400G Networking and 28GBd56GBd Testing Are you Ready
With PAM4 moving into production and 400G design efforts in full swing, the test challenges around characterization, verification and debug, and manufacturing testing have never been greater. This web...
Understanding Differences between PCI Express 4050 and IEEE High Speed Electrical Specifications
Our Tektronix domain experts, Dan Froelich and Pavel Zivny, contrast the methodologies of the PCI Express 4.0/5.0 and IEEE 26 GBd NRZ/PAM4 electrical specifications and engage in a lively discussion o...
Practical 400G PAM4 Test Methods - Optical and Electrical Measurement
The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presenta...