PCI Express

PCI Express

使用 Tektronix 測試解決方案,以加快您的 PCIe 設計分析、驗證及預相容性測試的速度。

有了可用於發射器和接收器測試的儀器和分析軟體,我們的解決方案提供執行深入分析、相容性測試和除錯的功能,適用於目前和下一代 PCIe 規格 (Gen 1、2、3 標準和現在的 PCIe 4.0)。

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Overcoming Receiver Test Challenges in Gen4 I/O Applications

This new application note provides vital information on performing compliance and diagnostic tests for Gen4 enterprise receivers with Bit Error Rate Testers.  

Logic Analyzer Fundamentals

Learn the basics and benefits of logic analyzers - see how this tool can solve your debug challenges.

克服 PCI-Express 實體層挑戰

使用 Tektronix 邏輯通訊協定分析儀的強大觸發和多個資料檢視等功能,來克服實體層的挑戰。



尋找 PCIE 流量控制錯誤

本白皮書詳細介紹了如何使用鳥瞰圖 (BEV) 來調查流量控制,這是一個全新的視覺化效果。


Pinpoint 觸發系統採用矽鍺技術 (SiGe) 半導體實行方法,所有觸發功能皆可使用示波器的所有類比頻寬。本文討論了觸發技術基礎知識,以及Pinpoint觸發與搜尋和標記功能如何將即時示波器中的觸發技術提升到全新的水準。

使用 Tektronix 通訊協定分析儀執行 PCI Express 探測解決方案

本白皮書討論如何確保正確的電路板設計和佈局,以使用 Tektronix PCIe 通訊協定分析儀進行數位除錯和驗證。

PCI Express® 發射器 PLL 測試 - 方法比較

執行 PLL 測試的顯著方法概述

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Understanding the Transition to Gen4 Enterprise & Datacenter I/O Standards

This whitepaper provides important information about adaptive equalization and link training, the impact of forward error correction (FEC) on compliance testing, debugging protocol handshaking and physical layer issues and new trends in channel performance evaluation along with other pertinent material when transitioning toGen4 standards.

10 Things to Know about PCI Express

Understand the important aspects of this continually changing standard with an overview of what’s new in PCIe Gen4, key considerations in setting up a comprehensive debug process, including loopback initiation and protocol handshaking, along with procedures of transmitter and receiver testing to keep in mind and more.

The MSO/DPO70000 Series oscilloscope delivers exceptional signal acquisition…


In this video we look at a topic that is becoming increasingly important in the…


Debug physical layer and link training issues quickly for standards running up to…

Understanding Differences between PCI Express 4.0/5.0 and IEEE High Speed Electrical Specifications

Our Tektronix domain experts, Dan Froelich and Pavel Zivny, contrast the methodologies of the PCI Express 4.0/5.0 and IEEE 26 GBd NRZ/PAM4 electrical specifications and engage in a lively discussion of the pros/cons of the approaches taken by each.

Addressing PCIe Gen1-5 Test and Debug Challenges with Confidence

Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and debug for PCIE Gen1-5.

Getting to PCI Express Compliance Faster

This webinar will provide the information on test processes for PCIe devices to allow you to reach compliance faster.

Overcoming Challenges in PCI Express Compliance Testing

Learn the keys to debugging, verifying design and performing interoperability testing for PCI Express revisions 3.0 and 4.0.

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

PCIe Gen 4.0 Rx & Link Equalization Test Procedure MOI

This document cover the Method of Implementation (MOI) for PCIe Gen 4.0 Rx and Link Equalization Test Procedures.

PCIe Gen 4.0 CEM Add-in Card PLL Bandwidth Test Procedure MOI

This document cover the Method of Implementation (MOI) for PCIe Gen 4.0 CEM Add-in Card PLL Bandwidth Test Procedures.

PCIe Gen 4.0 TX CEM Test Procedure MOI

This document cover the Method of Implementation (MOI) for PCIe Gen 4.0 TX CEM Test Procedures.

PCIe Gen 3.0 Link Equalization System and Add-in Card Test Procedure

Tektronix PCI Express Gen3 Link EQ test MOI. This document cover Link EQ testing for both System DUT and Add-In Card.

PCI Express 3.0 PLL Test MOI for Add-In Cards

This document covers the Method of Implementation (MOI) for PCI Express 3.0 Phase-Lock-Loop (PLL) testing for Add-In Cards (AIC).

PCI Express 3.0 卡發射器測試 MOI

本文件涵蓋使用DPO70000系列示波器進行 PCI Express 3.0 CEM 卡發射器測試的實作方法 (MOI)。

PCI Express 3.0 系統發射器測試 MOI

本文件涵蓋使用DPO70000系列示波器進行 PCI Express 3.0 CEM 系統發射器測試的實作方法 (MOI)。

適用於基礎規格的 PCI Express 3.0 接收器測試 MOI

本文件涵蓋使用 BERTScope 儀器進行 PCI Express 3.0 BASE 接收器測試的實作方法 (MOI)。

PCIe Gen3 (8GT/s) Receiver Jitter Tolerance Test MOI

This document covers the Method of Implementation (MOI) for PCIe Gen3 (8GT/s) Receiver Jitter Tolerance Test (Add-In Card and System) using Tektronix BSX Series BERTScope Bit Error Tester and ‘BERTScope PCIE3.0 Receiver Testing’ Application.

驗證+除錯和特性分析的實作方法 (MOI)

DPOJET 選配 PCE -- PCI Express 量測和設定程序庫



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