Tektronix 會向 MIPI 設計人員 (例如設計自動駕駛系統、車用資訊娛樂或其他行動裝置者) 提供適用於 M-PHY、D-PHY 和 C-PHY 的 MIPI PHY 發射器、接收器和通訊協定測試解決方案之組合。 這些解決方案跟隨著快速變更的 MIPI 標準,提供設計人員所需的未來前瞻性之測試解決方案,以便其有效率地推出新產品。

最新消息!業界第一個接收器測試解決方案,詳盡包含了 MIPI 聯盟最新發佈的 D-PHY 2.0 版規格,以及 C-PHY 1.1 版接收器測試規格的完整支援。

使用 Tektronix 示波器、AWG、BERT 和軟體的發射器和接收器測試

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Oscilloscope Probing for MIPI M-PHY TX Measurements

This application note reviews the requirements of the M-PHY standard that relate to oscilloscope probing, discusses tests required in the M-PHY Physical Layer Conformance Test Suite (CTS), and provides practical examples of M-PHY probing with currently available oscilloscopes and probes.




Pinpoint 觸發系統採用矽鍺技術 (SiGe) 半導體實行方法,所有觸發功能皆可使用示波器的所有類比頻寬。本文討論了觸發技術基礎知識,以及Pinpoint觸發與搜尋和標記功能如何將即時示波器中的觸發技術提升到全新的水準。

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Probing Tips for High Performance Design and Measurement

Learn how to identify common signal integrity problems experienced in high speed and mobile designs, modeling techniques used to study and de-embed the effects of probing, probing considerations for low power circuits and much more in this detailed application note for high performance designs.

瞭解和執行 MIPI M-PHY 實體層和通訊協定層測試

檢視本應用摘要,瞭解相關背景知識,以及如何執行 MIPI M-PHY 測試。


當今嵌入式系統已經無所不在。嵌入式系統可簡單定義為屬於大 型系統或機器的一部分,是一種專用的電腦系統,其目的是為該 系統或機器提供監測和控制服務。典型的嵌入式系統是從啟動時 即開始執行某些專用的應用程式,直到關閉後才會停止。當前設 計和製造的所有電子裝置,均屬於嵌入式系統。

TekExpress 軟體和 MIPI® 實體層和通訊協定層測試

利用 Tektronix TekExpress 軟體和示波器來瞭解和執行 MIPI®D-PHY 實體層、CSI 和 DSI 通訊協定層測試。

The Tektronix P7700 TriMode Probe supports solder connections to a device under…


The NEW P7700 Series TriMode Probe provides the highest probe fidelity available…


This webinar provides insight into the future of mobile device design and test,…

Demystify MIPI D-PHY and C-PHY Transmitter and Receiver Physical Layer Test

During this webinar, you'll gain an understanding of MIPI test challenges for both MIPI high-speed physical layers and useful tips and technical insights into characterizing and validating design compliance.

How to Design Longer Battery Life in Mobile Computing Devices

This Tektronix Webinar discusses current monitoring over time to assess a semiconductor system's power performance with an emphasis on higher accuracy. In this 35 minute instructional webinar, engineers can learn how to validate a semiconductor's ability to preserve as much battery life as possible when placed in mobile computing devices.

Additional product info: 2400 Series SMU's  and  2300 Series DC Power Supplies

HDMI 2.0 Webinar

Development & Testing of Next Generation HDMI Interfaces.

PHY Layer Testing for MIPI DPHY & MPHY Bus Compliance

Learn how to setup and perform verification and debug tests on the electrical PHY Layer for DPHY and MPHY serial interconnects as specified by the MIPI Alliance for mobile device designs.

MIPI C-PHY Receiver Conformance Test MOI Ver 1.2
MIPI D-PHY 測試實作方法 (MOI)

驗證、除錯、特性分析、相容性和互通性測試的實作方法 (MOI)

MIPI® M-PHY 實作方法

本文件包含 MIPI® M-PHY* 量測和安裝程序庫實作方法 (MOI),進行驗證、除錯、特性分析、相容性和互通性測試



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