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DDR 測試、驗證與除錯

DDR Memory SDLA

DDR 記憶體介面

有越來越多的裝置使用雙倍資料率 (DDR) 記憶體。最初是從筆記型電腦、電腦和行動裝置開始,現在正朝向尖端服務器、汽車和雲端運算應用程式發展。測試和驗證 DDR 系統的效能可能深具挑戰性,但使用採納記憶體技術的示波器、探棒和測試自動化軟體來升級您的工作台,可讓程序變得更簡單且更有效率。

資料庫
Title
DesignCon 2015 Paper - Designing High Performance Interposers with 3-port and 6-port S-parameters
This technical paper explains how multiport S-parameters can be used to validate memory interposer design cases. This helps memory designers understand some of the performance characteristics that can …
The NEW P7700 Series TriMode Probe provides the highest probe fidelity available for real-time oscilloscopes. Watch our 60-second video to see how this new probe can help minimize noise and easily …
55s
The MSO/DPO70000 Series oscilloscope delivers exceptional signal acquisition performance and analysis capability. Discover your real signals and capture more signal details with the industry's …
5m 50s
The Tektronix P7700 TriMode Probe supports solder connections to a device under test. In this video, you will learn the Tektronix recommended procedure for attaching a solder tip to a device.
5m 59s
Title
New Characterization Techniques for DDR4-LPDDR4 and Next Generation Memory Standards
This webinar provides an update on the latest characterization and debug techniques to enable analysis of the highest DDR4/LPDDR4 speed grades (DDR4-3200/LPDDR4-4266). Learn about: • New probing …
Memory Interface Verification and Debug
This webinar will explain how to prepare for next generation DDR-based memory testing. Learn about the changes these new standards bring to electrical verification and how to prepare for proper signal …
Efficiently Design and Electrically Validate a DDR4 Interface
This webinar will show how Cadence and Tektronix can enable you with flexible and power efficient DDR4 IP, design and analysis tools used in the office, and lab-based solutions to address the key …