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Greater Reliability Testing Confidence from Lab to Fab - Wafer Level Reliability Test Solutions

Keithley Instruments has long been an industry leader in both overall parametric test technology and wafer level reliability (WLR) testing.

Several generations of Keithley’s parametric test solutions have offered WLR test algorithm libraries as options. That gives us decades of experience in creating integrated hardware and software solutions for emerging test needs in device characterization, semiconductor parametric test, and electrical parametric process monitoring. Plus, our years of working with WLR users at every technology node have given us an in-depth understanding of the changing needs associated with reliability testing.