DDR 測試、驗證與偵錯

DDR4 和 LPDDR3 等新世代產品提供更快的速度、更低的 I/O 電壓以及各種外形規格,滿足不同的應用需求。更有限的邊際、更快的邊緣速率和更複雜的匯流排通訊通訊協定為除錯與驗證帶來全新的挑戰。

Tektronix 提供最完整的記憶體驗證與除錯工具組:

  • DDR 電子驗證:
    對 DDR 記憶體介接的訊號行為、抖動、眼圖大小、交叉、閃頻/時脈對齊、位元錯誤進行擷取、量測和特性分析。
  • DDR 邏輯驗證:
    擷取和量測 DDR 記憶體介面的數位邏輯狀態,並根據匯流排週期執行時序與通訊通訊協定分析。
     
  • DDR 通訊通訊協定效能驗證:
    擷取和分析匯流排指令、控制時序、參照記憶體介面規格進行結果比較,並分析匯流排流量作為匯流排利用率與匯流排效能的指標。

資料庫

Title
DesignCon 2015 Paper - Designing High Performance Interposers with 3-port and 6-port S-parametersThis technical paper explains how multiport S-parameters can be used to validate memory interposer design cases. This helps memory designers understand some of the performance characteristics that can be inferred from S-parameters, as well as some of the interactions between the interposer and the device under test and probing system; leading to more accurate validation efforts on very fast memory systems utilizing DDR4 or LPDDR4.

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Title
New Characterization Techniques for DDR4/LPDDR4 and Next Generation Memory Standards
This webinar provides an update on the latest characterization and debug techniques to enable analysis of the highest DDR4/LPDDR4 speed grades (DDR4-3200/LPDDR4-4266).  
 
Efficiently Design and Electrically Validate a DDR4 Interface

This webinar will show how Cadence and Tektronix can enable you with flexible and power efficient DDR4 IP, design and analysis tools used in the office, and lab-based solutions to address the key challenges in electrical validation of the DDR4 interface.

Memory Interface Verification and Debug

This webinar will explain how to prepare for next generation DDR-based memory testing. Learn about the changes these new standards bring to electrical verification and how to prepare for proper signal access to LPDDR3 and DDR4 memory systems. Get advance knowledge to plan for proper instrument selection needed for performing electrical verification tests on these emerging standards.

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