TDS8000B

Digital Sampling Oscilloscope
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Features & Benefits

  • DC to 70+ GHz Bandwidth*1
  • Exceptional Trigger Jitter and Horizontal Timebase Stability
  • Modular Architecture
  • Up to Eight Channels Acquisition
  • High Resolution and Measurement Repeatability
  • Comprehensive, Accurate, Automatic Measurement System
  • Intuitive User Interface
    • Large Display (10.4 in.)
    • Microsoft Windows-based Graphical User Interface
  • Windows 2000 for enhanced network security

Applications

  • Semiconductor Testing
  • Impedance and Crosstalk Characterization (using TDR)
  • High-speed Digital Data Communications

*1 Bandwidth is determined by plug-in modules and may exceed 70 GHz should higher speed modules become available in the future.

The TDS8000B Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000B is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages, cables and high-speed digital communications.

State-of-the-art Waveform Acquisition

The TDS8000 Series' state-of-the-art timebase provides equivalent time sweep speeds from 1.0 ps/div to 5 ms/div with record lengths from 20 to 4000 points and a sample interval down to 10 femtoseconds (0.01 ps). In addition, the 8000 Series Sampling Oscilloscopes' timebases can be locked to a 10 MHz reference providing greater long-term stability. This capability also allows multiple TDS8000Bs to be synchronized to other test equipment and/or the device-under-test.

The TDS8000B offers two magnification windows, whereby sections of the main trace are re-acquired at higher resolution for closer examination of details.

The TDS8000B boasts the highest sample rate among sampling oscilloscopes. Its multi-processor architecture, with dedicated per channel digital signal processors (DSP), guarantees the highest waveform acquisition rates regardless of the number of channels acquired or waveform processing done.

Modularity and Flexibility

The TDS8000B supports a large and growing family of electrical and optical plug-in modules. This modular architecture lets you configure the instrument with the right features for your application both now and in the future.

The electrical plug-ins include a variety of modules with typical bandwidths up to 70+ GHz and specialized features such as TDR for impedance and crosstalk characterizations. High bandwidth probes are also available for constructing a total acquisition solution.

The available optical modules provide complete optical test solutions for both telecom (155 Mb/s to 43 Gb/s) and datacom (Fibre Channel, InfiniBand and Gigabit Ethernet) applications as well as general-purpose optical signal testing.

Unmatched TDR Capabilities

With the 80E04 TDR Sampling Module, the TDS8000B offers unmatched TDR performance on up to eight channels simultaneously. Each channel has an independent polarity selectable step-generator offering unmatched 35 ps reflected rise time*2. The TDS8000B provides the only true differential TDR system available today. Automatic, transparent correction for variations in step amplitude and baseline offset guarantee accuracy and repeatability of impedance measurements.

8000 Series Sampling Oscilloscope Platform

The TDS8000B is built on Tektronix' sampling oscilloscope platform that combines familiar MS Windows-based PC technologies with world-class waveform acquisition technology.

This platform provides a wide array of standard instrumentation and communications interfaces (such as GPIB, parallel printer port, RS-232-C and USB serial ports and an Ethernet LAN connection). In addition, the platform includes several mass storage devices (floppy disk, removable hard drive and CD-ROM).

The TDS8000B is equipped with a large, full-color display that helps you discriminate waveform details. Color-grading of waveform data adds a third dimension - sample density - to your signal acquisitions and analysis.

Gated triggering, a feature that allows the exclusion of selected time periods from being measured, is offered as an option.

Because the system supports an open MS Windows environment, new levels of data analysis can be done directly on the instrument using commercially available software packages.

Additionally, TekVISA™, a standard software feature, allows the instrument to be placed under the control of software applications (e.g. LabView, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument, or on external PC workstations network connected to the instrument, without the need for a GPIB hardware interface. Plug and play drivers for LabView and other programs are also supplied.

*2 The observed rise time of a reflection from a short circuit.

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8000 Series Sampling Oscilloscope Optical Modules

80C01 Multi-rate Telecom Sampling Module - The 80C01 module supports waveform conformance testing of long-wavelength (1100 to 1650 nm) signals at 622, 2488 Mb/s and 9.953 Gb/s as well as general-purpose testing with up to 20 GHz optical bandwidth. With its clock recovery option, the 80C01 provides testing solutions for 622 and 2488 Mb/s telecom applications.

80C02 High-performance Telecom Sampling Module - The 80C02 module is optimized for testing of long-wavelength (1100 to 1650 nm) signals at 9.953 Gb/s (SONET OC-192/SDH STM-64). With its high optical bandwidth of 30 GHz (typical), it is also well-suited for general-purpose high-performance optical component testing. The 80C02 can be optionally configured with clock recovery that supports 9.953 Gb/s telecom standards.

80C07B Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C07B module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module optimized for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with clock recovery that supports 155, 622, 1063, 1250, 2125, 2488, 2500 and 2666 Mb/s rates.

80C08C Multi-rate, Datacom & Telecom Optical Sampling Module with 10 GbE Forward Error Correction - The 80C08C module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module providing datacom rate testing for 10GbE applications at 9.953, 10.3125, 11.0957 Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s. The 80C08C also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power level optical signals. The 80C08C can be optionally configured with clock recovery options that can support any standard or user defined rate in the continuous range from 9.8 to 12.6 Gb/s.

80C10 65 GHz 40 Gbps Optical Sampling Module with 43 Gbps ITU-T G.709 Forward Error Correction - The 80C10 module provides integrated and selectable reference receiver filtering, enabling conformance testing at either 1310 nm or 1550 nm for 39.813 Gbps (OC-768/STM-256) and 43.018 Gbps (43 Gbps ITU-T G.709 FEC) rates. In addition to the filter rates, the user may also choose selectable bandwidths of 30 GHz or 65 GHz for optimal noise vs. bandwidth performance for accurate signal characterization.

80C11 Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C11 module is a long wavelength (1100 to 1650 nm) multi-rate optical sampling module optimized for testing 10 Gb/s datacom and telecom standard rates at 9.953, 10.3125, 10.51875, 10.664, 10.709, and 11.0957 Gb/s. With its high optical bandwidth of up to 30 GHz (typical) it is well-suited for general purpose high-performance 10 Gb/s optical component testing. The 80C11 can be optionally configured with clock recovery options that can support any standard or user defined rate in the continuous range from 9.8 to 12.6 Gb/s.

80C12 Multi-rate, Datacom & Telecom Optical Sampling Module - The 80C12 module is a broad wavelength (700 to 1650 nm) multi-rate optical sampling module providing multi-rate telecom and datacom testing. This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10Gb/s applications. The low data rate applications include: 1, 2, and 4 Gb/s FibreChannel and “by 4” wavelength division multiplex standards such as 10GBase-X4 and 4-Lane 10 Gb/s FibreChannel. The supported 10Gb/s application includes both datacom and telecom application. The supported 10Gb/s datacom applications include 10GbE applications at 9.953, 10.3125, 11.0957 Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s. The 80C12 also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power level optical signals. Clock recovery for the 80C12 is provided via the 80A05 (sold separately).

8000 Series Sampling Oscilloscope Electrical Modules

80E01 Sampling Module - The 80E01 is a single-channel, 50 GHz bandwidth sampling module. The 80E01 has a measured bandwidth of 50 GHz or more and a calculated rise time of 7.0 ps or less. Displayed noise is typically 1.8 mVRMS. The front-panel connector is female 2.4 mm and an adapter is provided (2.4 mm male to 2.92 mm female) to maintain compatibility with SMA connector systems.

80E02 Low-noise Sampling Module - The 80E02 is a dual-channel, 12.5 GHz sampling module specifically designed for low-noise measurements in digital communications and device characterization applications. It provides an acquisition rise time of 28 ps and typically 400 μVRMS of displayed noise. The 80E02 is the ideal instrument for low-noise applications. Common applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits, making accurate statistical measurements of signal noise and signal timing jitter or obtaining stable timing measurements of fast digital ICs.

80E03 Sampling Module - The 80E03 is a dual-channel, 20 GHz sampling module. This sampling module provides an acquisition rise time of 17.5 ps.

80E04 TDR Sampling Module - The 80E04 is a dual-channel, 20 GHz sampling module with TDR capability. This sampling module provides an acquisition rise time of 17.5 ps, with a typical 20 GHz equivalent bandwidth. The TDR feature provides high resolution with true differential capability and fast 35 ps reflected rise time of the TDR slope.

80E06 70+ GHz Sampling Module - The 80E06 is a single channel, 70+ GHz (typical bandwidth) sampling module with 5.0 ps calculated rise time. Typical RMS noise is 1.8 mV. This sampling module provides a 1.85 mm (Type V) front-panel connector and a precision adapter to 2.92 mm with a 50 Ω termination. 1 meter or 2 meter length Extender Cables can be ordered for remote operation of the sampling module from the sampling oscilloscope mainframe.

80A05 Electrical Clock Recovery Module - The 80A05 enables clock recovery for electrical signals, as well as internal triggering on the recovered clock. The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.26 Gb/s range. Option 10G adds support for standard rates up to 12.6 Gb/s. The module accepts either single-ended or differential signals at its input, providing both single-ended and differential clock recovery. This module also serves as the clock recovery module for the 80C12.

Characteristics

Signal Acquisition

Acquisition Modes - Sample (normal), envelope and average.

Number of Sampling Modules Accommodated - Up to four, dual-channel electrical and two, single-channel optical sampling modules.

Number of Simultaneously Acquired Inputs - Eight channels maximum (eight electrical or two optical and six electrical).

Vertical Systems

Rise Time/Bandwidth - Determined by the sampling modules used.

Vertical Resolution - 14 bits over the sampling modules' dynamic range.

Horizontal System

Main and Magnification View Timebases - 1 ps/div to 5 ms/div in 1-2-5 sequence or 1 ps increments.

Maximum Trigger Rate - 200 kHz.

Typical Acquisition Rate - 150 Ksamples/sec. per channel.

Time Interval Accuracy -

Horizontal scale <21 ps/div: 1 ps + 1% of interval.

Horizontal scale ≥21 ps/div:

8 ps +0.1% of interval (short-term optimized mode).

8 ps + 0.01% of interval (locked to 10 MHz mode).

Horizontal Deskew Range: -500 ps to +100 ns on any individual channel in 1 ps increments.

Record Length - 20, 50, 100, 250, 500, 1000, 2000 or 4000 samples.

Magnification Views - In addition to the main timebase, the TDS8000B supports two magnification views. These magnifications are independently acquired using separate timebase settings.

Trigger System

Trigger Sources - External direct trigger.

External pre-scaled trigger.

Internal clock trigger: internally connected to direct trigger.

Clock recovery triggers (from optical sampling modules): internally connected to pre-scaled trigger.

Trigger Sensitivity -

External direct trigger input:

50 mV, DC - 4 GHz (typical).

100 mV, DC - 3 GHz (guaranteed).

Pre-scaled trigger input:

800 mV, 2 to 3 GHz (guaranteed).

600 mV, 3 to 10 GHz (guaranteed).

1000 mV, 10 to 12.5 GHz (typical).

Jitter -

Short-term jitter optimized mode:

≤0.8 psRMS + 5 ppm of position (typical).

≤1.2 psRMS + 10 ppm of position (max.).

Locked to 10 MHz reference:

1.6 psRMS + 0.01 ppm of position (typical).

≤2.5 psRMS + 0.04 ppm of position (max.).

Internal Clock - Adjustable from 25 to 200 kHz (drives TDR, internal clock output and calibrator).

Trigger Level Range - ±1.0 V.

Trigger Input Range - ±1.5 V.

Trigger Holdoff - Adjustable 5 μs to 100 ms in 2 ns increments.

External Trigger Gate (optional) - TTL logic 1 enables acquisition, a TTL logic 0 disables acquisition, maximum non-destruct input level ± 5 V.

Display Features

Touch Screen Display - 10.4 in. diagonal, color.

Colors - 16,777,216 (24 bits).

Video Resolution - 640 horizontal by 480 vertical displayed pixels.

Math/Measurement System Measurements - The TDS8000B supports up to eight simultaneous measurements, updated three times per second with optional display of per measurement statistics (min, max, mean and standard deviation).

Measurement Set - Automated measurements include RZ, NRZ, and Pulse Signal types and the following:

Amplitude Measurements High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height, Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, Pk-Pk, +Overshoot, -Overshoot, Mean, +Duty Cycle, Cycle Mean, RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio (Ratio, %, dB), Suppression Ratio (Ratio, %, dB), Peak to Peak Noise, RMS Noise, Q-Factor, SNR, Average Optical Power, (dBm, watts), Phase, Optical Modulation Amplitude.

Timing Measurements Rise, Fall, Period, Bit Rate, Bit Time, Frequency, Crossing (%, Level, Time), +Cross, -Cross, Jitter (peak-to-peak, RMS), Eye Width, +Width, -Width, Burst Width, +Duty Cycle, -Duty Cycle, Duty Cycle Distortion, Delay, Phase.

Area Measurements Area, Cycle Area.

Cursors - Dot, vertical bar and horizontal bar cursors.

Waveform Processing - Up to eight math waveforms can be defined and displayed using the following math functions: Add, Subtract, Multiply, Divide, Average, Differentiate, Exponentiate, Integrate, Natural Log, Log, Magnitude, Min, Max, Square Root and Filter.

In addition, measurement values can be utilized as scalars in math waveform definitions.

TDR System (TDS8000B with 80E04 Electrical Module)

TDR Channels - 2 per 80E04.

TDR Amplitude - 250 mV (polarity of either step may be inverted).

TDR System Rise Time - <35 ps.

Time Coincidence Between TDR Steps - <1 ps.

Source Resistance - 50 ±0.5 Ω.

Typical Aberrations (at +250 mV amplitude) - ±3% or less over zone 10 ns to 20 ps before step transition.

+10%, -5% or less, for first 400 ps following step transition.

±3% or less over zone 400 ps to 5 ns following step transition.

±1% or less over zone 5 ns to 100 ns following step transition.

±0.5% after 100 ns following step transition.

Power Requirements

Line Voltage and Frequency - - 100 to 240 VAC ±10% 50/60 Hz.

115 VAC ±10% 400 Hz.

Environmental

Temperature - Operating: +10 °C to +40 °C.

Nonoperating: -22 °C to +60 °C.

Relative Humidity - Operating: Floppy disk and CD ROM not installed: 20% to 80% at or below 40 °C (upper limit de-rates to 45% relative humidity at 40 °C).

Nonoperating: 5% to 90% at or below 60 °C (upper limit de-rates to 20% relative humidity at +60 °C).

Altitude - Operating: 3048 m (10,000 ft.); nonoperating: 12190 m (40,000 ft.).

Safety - UL 3111-1, CSA-22.2 No. 1010.1, EN 61010-1.

Physical Characteristics for Optical Sampling Modules

   

Dimensions (mm/inches)

Weight (kg/lb)

   

Width

Height

Depth

Net

80C01

165/6.5

25/1.0

305/12.0

<2.61/<5.75

80C02

165/6.5

25/1.0

305/12.0

<2.61/<5.75

80C07B

165/6.5

25/1.0

305/12.0

<1.36/<3.0

80C08C

165/6.5

25/1.0

305/12.0

<1.22/<2.7

80C10

165/6.5

25/1.0

305/12.0

>2.61/>5.75

80C11

165/6.5

25/1.0

305/12.0

<1.22/<2.7

80C12

165/6.5

25/1.0

305/12.0

<2.61/<5.75

Optical Sampling Module Characteristics (Refer to Optical Sampling Module User Manual for more detailed information)

   

Application Type

Standards and supported data filtering rates

Number of Input Channels

Effective Wavelength Range

Calibrated Wavelengths

80C01

Tributary Telecom

OC-12/STM-4 (622 Mb/s), OC-48/STM-16 (2.488 Gb/s), OC-192/STM-64 (9.953 Gb/s)

1

1100 nm to 1650 nm

1310 nm and 1550 nm (±20 nm)

80C02

10 Gb/s Telecom

OC-192/STM-64 (9.953 Gb/s)

10GBASE-W (9.953 Gb/s)

1

1100 nm to 1650 nm

1310 nm and 1550 nm (±20 nm)

80C07B

Tributary Datacom/Telecom

Standard Included: OC-48/STM-16 (2.488 Gb/s), Infiniband, 2 GbE (2.500 Gb/s);Optional (choose any two): OC-3/STM-1 (155 Mb/s), OC-12/STM-4 (622 Mb/s), FibreChannel (1.063 Gb/s), GbE (1.250 Gb/s), 2G FibreChannel (2.125 Gb/s)

1

700 nm to 1650 nm

780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)

80C08C

10 Gb/s Datacom/Telecom

OC-192/STM-64 (9.953 Gb/s), 10GBASE-W (9.953 Gb/s), 10GBASE-R (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s),10 GbE FEC (11.1 Gb/s)

1

700 nm to 1650 nm

780 nm, 850 nm, 1310 nm, and 1550 nm (±20 nm)

80C10

40 Gb/s Telecom

OC-768/STM-256 (39.813 Gb/s),ITU-T G.709 FEC (43.018 Gb/s)

1

1310 nm and 1550 nm

1310 nm and 1550 nm (±20 nm)

80C11

10 Gb/s Datacom/Telecom

OC-192/STM-64 (9.953 Gb/s), 10GBASE-W (9.953 Gb/s), 10GBASE-R (10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s), 10 GbE FEC (11.1 Gb/s)

1

1100 nm and 1650 nm

1310 nm and 1550 nm (±20 nm)

80C12

FibreChannel, Datacom rates between 2.5Gb/s and 10Gb/s.

Option 10G: 10Gb/s multistandard low cost

Option 10G: OC192/STM64 (9.953 Gb/s), 10GBaseW (9.953 Gb/s),10GBaseR (10.31 Gb/s),10 GFC (10.51 Gb/s), G.975 FEC (10.66 Gb/s), G.709 FEC (10.71 Gb/s), 10 GBE FEC (11.10 Gb/s).

Option F1: 1.063 Gb/s, 2.125 Gb/s, and 4.25 Gb/s FC.

Option F2: 2.125 Gb/s, 4.25 Gb/s FC, 9 GHz.

Option F3: 1.063 Gb/s, 2.125 Gb/s FC, 9 GHz.

Option F4: 2.125 Gb/s, 10GBase-LX4, 3.188Gb/s, 4.25 Gb/s FC.

Option F5: 10GBase-LX4, 3.188Gb/s, 4.25 Gb/s FC, 9 GHz.

Option F6: 2.125 Gb/s FC, 10GBase-LX4, 3.188Gb/s, 9 GHz.

Option FC: 11GBase-LX4 filter, 3.188Gb/s, 3.318 GHz, 9 GH

1

700 nm to 1650 nm

850, 1310 and 1550 nm (±20 nm)

Optical Sampling Module Characteristics (continued)

   

Clock Recovery (Optional)

Clock Recovery Outputs

Unfiltered Optical Bandwidth*1

Absolute Maximum Nondestructive Optical Input

Internal Fiber Diameter

80C01

Option CR: 622 Mb/s, 2.488 Gb/s

±Clock, ±Data

20 GHz

5 mW average; 10 mW peak power at wavelength of highest relative responsivity

9 μm/125 μm single-mode

80C02

Option CR: 9.953 Gb/s

Clock, Clock/16, Data

28 GHz

5 mW average; 10 mW peak power at wavelength of highest relative responsivity

9 μm/125 μm single-mode

80C07B

Option CR1: 155 Mb/s, 622 Mb/s, 1.063 Gb/s, 1.250 Gb/s, 2.125 Gb/s, 2.488 Gb/s, 2.500 Gb/s, 2.666 Gb/s

±Clock, ±Data

2.5 GHz

5 mW average; 10 mW peak power at wavelength of highest responsivity

62.5 μm/125 μm multi-mode

80C08C

Option CR1: 9.953 Gb/s, 10.31 Gb/s;

Option CR2: 10.31 Gb/s, 10.52 Gb/s;

Option CR4: Continuous from 9.8 Gb/s to 12.6 Gb/s

Clock, Clock/16

10 GHz

1 mW average; 10 mW peak power at wavelength of highest responsivity

single-mode and multi-mode fibers up to core diameter of 62.5 μm

80C10

Future Upgradeable

Future

65 GHz

20 mW average; 60 mW peak power at wavelength of highest relative responsivity

9 μm/125 μm single-mode

80C11

Option CR1: 9.953 Gb/s;

Option CR2: 9.953 Gb/s, 10.664 Gb/s;

Option CR3: 9.953 Gb/s, 10.709 Gb/s;

Option CR4: Continuous between 9.8 Gb/s to 12.6 Gb/s

CR1: Clock, Clock/16, Data;

CR2, CR3, CR4: Clock, Clock/16

28 GHz

5 mW average; 10 mW peak power at wavelength of highest responsivity

9 μm/125 μm single-mode

80C12

Provided by separately sold 80A05 (50 Mb/s to 12.6 Gb/s)

(Clk/16, 10G Clk)

4 to 10 Gb/s depending on option

1mW average; 10 mW peak power at wavelength of highest responsitivity

single-mode and multi-mode fibers up to core diameter of 62.5 μm

*1 Values shown are warranted unless printed in an italic typeface which represents a typical value.

Optical Sampling Module Characteristics (continued)

   

Optical Return Loss

Fiber Input Accepted

RMS Optical Noise (typical)

RMS Optical Noise (maximum)

Independent Channel Deskew

80C01

>30 dB

single-mode

8.0 μW at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s, 12.5 GHz;

15.0 μW at 20 GHz

12.0 μW at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s, 12.5 GHz;

25 μW at 20 GHz

Standard

80C02

>30 dB

single-mode

6.0 μW at 9.953 Gb/s, 12.5 GHz;

10.0 μW at 20 GHz;

15.0 μW at 30 GHz

10.0 μW at 9.953 Gb/s, 12.5 GHz mode;

15 μW at 20 GHz;

30 μW at 30 GHz

Standard

80C07B

>14 dB (multi-mode) >24 dB (single-mode)

single- or multi-mode

0.50 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;

0.70 μW at 2.488/2.500 Gb/s

1.0 μW at 155 Mb/s, 622 Mb/s, 1063 Mb/s, 1250 Mb/s;

1.5 μW at 2.488/2.500 Gb/s

Standard

80C08C

>14 dB (multi-mode) >24 dB (single-mode)

single- or multi-mode

1.7 μW at all filter rates

3.0 μW at all filter rates

Standard

80C10

>30 dB

single-mode

40 μW at 39.813 Gb/s, 43.018 Gb/s (1550 nm); 75 μW at 39.813  Gb/s, 43.018 Gb/s (1310 nm);

30 μW at 30 GHz mode (1550 nm); 55 μW at 30 GHz mode (1310 nm);

85 μW at 65 GHz mode (1550 nm); 150 μW at 65 GHz mode (1310 nm)

60 μW at 39.813 Gb/s, 43.018 Gb/s (1550 nm); 110 μW at 39.813 Gb/s, 43.018 Gb/s (1310 nm);

50 μW at 30 GHz (1550 nm); 90 μW at 30 GHz (1310 nm);

120 μW at 65 GHz (1550 nm); 220 μW at 65 GHz (1310 nm)

Standard

80C11

>30 dB

single-mode

5.5 μW at all filter rates;

10.0 μW at 20 GHz

20.0 μW at 30 GHz

8.0 μW at all filter rates;

14.0 μW at 20 GHz

30.0 μW at 30 GHz

Standard

80C12

>14 dB (62.5 μm multi-mode)

>24 dB (9 μm single mode)

single- or multi-mode

Below 9Gb/s: 1.7 μW

Above 9Gb/s and 9GHz: 3.4 μW

Below 9Gb/s: 3 µW

Above 9Gb/s and 9GHz: 6 µW

Standard

Optical Sampling Module Characteristics (continued)

   

Offset Capability

Power Meter

Power Meter Range

Power Meter Accuracy

Mask Test Optical Sensitivity*2

80C01

Standard

Standard

+4 dBm to -30 dBm

5% of reading

-8 dBm at 622 Mb/s, 2.488 Gb/s, 9.953 Gb/s; -5.0 dBm at 20 GHz

80C02

Standard

Standard

+4 dBm to -30 dBm

5% of reading

-9 dBm at 9.953 Gb/s; -7 dBm at 20 GHz; -4 dBm at 30 GHz

80C07B

Standard

Standard

+4 dBm to -30 dBm

5% of reading

-22 dBm at 155 Mb/s, 622 Mb/s; -20 dBm at 2488/2500 Mb/s

80C08C

Standard

Standard

0 dBm to -30 dBm

5% of reading

-15 dBm at all filter rates

80C10

Standard

Standard

+13 dBm to -21 dBm

5% of reading

0 dBm at 39.813 Gb/s, 43.018 Gb/s; 0 dBm at 30 GHz; +3 dBm at 65 GHz

80C11

Standard

Standard

+4 dBm to -30 dBm

5% of reading

-10 dBm at all filter rates; -7 dBm at 20 GHz; -4 [email protected] 30 GHz

80C12

Standard

Standard

0 dBm to -30 dBm

5% of reading

Below 9Gb/s: -15 dBm

Above 9Gb/s and 9GHz: -12 dBm

*2 Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for competitive comparison purposes. Assumes instrument peak-peak noise consumes most of the mask margin.

Physical Characteristics for Electrical Sampling Modules

   

Dimensions (mm/inches)

Weight (kg/lb)

   

Width

Height

Depth

Net

80E01

79/3.1

25/1.0

135/5.3

0.4/0.87

80E02

79/3.1

25/1.0

135/5.3

0.4/0.87

80E03

79/3.1

25/1.0

135/5.3

0.4/0.87

80E04

79/3.1

25/1.0

135/5.3

0.4/0.87

80E06

79/3.1

25/1.0

135/5.3

0.4/0.87

Electrical Sampling Module Characteristics (Refer to Electrical Sampling Module User Manual for more detailed information)

   

Application Type

Channels

Input Impedance

Channel Input Connector

Bandwidth*3

80E01

Microwave General Purpose

1

50 ±0.5 Ω

2.4 mm female precision adapter to 2.92 mm included with 50 Ω SMA termination

50 GHz

80E02

Low-level Signals

2

50 ±0.5 Ω

3.5 mm female

12.5 GHz*4

80E03

Device Characterization

2

50 ±0.5 Ω

3.5 mm female

20 GHz*4

80E04

TDR Impedance Characterization with single-ended, common, differential TDR capability

2

50 ±0.5 Ω

3.5 mm female

20 GHz*4

80E06

High-speed Electrical Device Characterization

1

50 ±0.5 Ω

1.85 mm female precision adapter to 2.92 mm included with 50 Ω SMA termination

70+ GHz

*3 Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.

*4 Risetime is calculated from the formula Risetime = 0.35/Bandwidth; Bandwidth is calculated from the formula Bandwidth = 0.35/Risetime

Electrical Sampling Module Characteristics (continued)

   

Rise Time (10% to 90%)

Dynamic Range

Offset Range

Maximum Input Voltage

Vertical Number of Digitized Bits

80E01

7 ps*4

1.0 Vp-p

±1.6 V

±2.0 V

14 bits full scale

80E02

≤28 ps

1.0 Vp-p

±1.6 V

±3.0 V

14 bits full scale

80E03

≤17.5 ps

1.0 Vp-p

±1.6 V

±3.0 V

14 bits full scale

80E04

≤17.5 ps

1.0 Vp-p

±1.6 V

±3.0 V

14 bits full scale

80E06

5.0 ps*4

1.0 Vp-p

±1.6 V

±2.0 V

14 bits full scale

*4 Risetime is calculated from the formula Risetime = 0.35/Bandwidth; Bandwidth is calculated from the formula Bandwidth = 0.35/Risetime

Electrical Sampling Module Characteristics (continued)

   

Vertical Sensitivity Range

DC Vertical Voltage Accuracy, Single Point, Within ±2 °C of Compensated Temperature

Typical Step Response Aberrations*5

RMS Noise*5

80E01

10 mV to 1.0 V full scale

± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +12%, -5% or less for the first 300 ps following step transition; +5.5%, -3% or less over the zone 300 ps to 3 ns following step transition; ±1% or less over the zone 3 ns to 100 ns following step transition; ±0.5% after 100 ns following step transition

1.8 mV

≤2.3 mV (maximum)

80E02

10 mV to 1.0 V full scale

± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, -5% or less for the first 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following step transition; ±1% or less over the zone 5 ns to 100 ns following step transition; ±0.5% after 100 ns following step transition

400 μV

≤800 μV (maximum)

80E03

10 mV to 1.0 V full scale

± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, -5% or less for the first 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following step transition; ±1% or less over the zone 5 ns to 100 ns following step transition; ±0.5% after 100 ns following step transition

600 μV

≤1.2 mV (maximum)

80E04

10 mV to 1.0 V full scale

± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, -5% or less for the first 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following step transition; ±1% or less over the zone 5 ns to 100 ns following step transition; 0.5% after 100 ns following step transition

600 μV

≤1.2 mV (maximum)

80E06

10 mV to 1.0 V full scale

± [2 mV + 0.007 (Offset) + 0.02 (Vertical Value - Offset)]

±5% or less for first 300 ps following step transition

1.8 mV

≤2.4 mV (maximum)

*5 Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.

TDR System (80E04 only)

   

80E04*6

Channels

2

Input Impedance

50 ±0.5 Ω

Channel Input Connector

3.5 mm

Bandwidth

20 GHz

TDR Step Amplitude

250 mV (polarity of either step may be inverted)

TDR System Reflected Rise Time

≤35 ps each polarity

TDR System Incident Rise Time

28 ps (typical)

TDR Step Maximum Repetition Rate

200 kHz

TDR System Step Response Aberrations

±3% or less over the zone 10 ns to 20 ps before step transition; +10%, -5% or less typical for the first 400 ps following step transition; ±3% or less over the zone 400 ps to 5 ns following step transition; ±1% or less after 5 ns following step transition

*6 Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.

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