如果您正在開發如矽基化合物半導體、太陽能電池薄膜,以及石墨烯等其他奈米材料或裝置,您將在半導體技術、電子產品、醫學裝置和醫療保健等領域的應用中,創造突破性的發展。我們將示範各種創新概念和技術,以精確分析所有進階材料的電子特性,其中包括:

  • 電化學特性分析
  • 奈米材料的量測
  • 石墨烯裝置結構的霍爾效應測試
  • 複合式半導體裝置/材料的脈衝 I-V 測試
  • 聚焦式離子束電流監控
  • 奈米晶體特性分析
  • 太陽能電池的 C-V 特性分析
  • 半導體參數分析
  • 超低電流量測

我們針對新材料和裝置的電子特性分析提供全方位的解決方案,協助您持續投入創新,重新塑造屬於我們的世界。

資料庫

Title
Performing Cyclic Voltammetry Measurements Using 2450-EC or 2460-EC Electrochemistry Lab Systems

This application note outlines using either a 2450-EC or 2460-EC Electrochemistry Lab System to perform cyclic voltammetry using the built-in test script and electrochemistry translation cable accessory kit.

Leakage Current and Insulation Resistance Measurements
Characterizing Nanoscale Devices with Differential Conductive Measurements

With appropriate instrumentation, the four-wire source current/measure voltage method is a great improvement over older differential conductance measurements, which are slow, noisy, and complex.  The new technique's single sweep shortens hours of data collection to a few minutes, while improving accuracy.

Hall Effect Measurements Essential for Characterizing High Carrier Mobility
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS
Resistivity Measurements Using the Model 2450 SourceMeter SMU Instrument and a Four-Point Collinear Probe
Making High Resistance Measurements on Small Crystals in Inert Gas or High Vacuum w/ the Model 6517A
Title
Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization

This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to get the most information about your device.

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