現今的消費者希望能有比以往更輕巧、更便宜且功能更強,但是運作時間更長的電子產品。為了因應這些具有衝突的需求,研究人員必須開發新型材料、縮小現有裝置的尺寸,並且提升裝置效率。在試圖提升裝置密度和效能同時降低耗電量的過程中,研究人員將目光轉向石墨烯和其他具有高載子移動率的二維 (2-D) 固體,以及有機半導體和奈米級裝置。

以新型電解質和電極材料為基礎的高校電池,將是延長運作時間的關鍵。此外,進階燃料電池技術也已展開研究,以期能夠使新一代的電動車在效能和價格上都更有吸引力。對於綠能發電解決方案的渴求,也促使專家開始研究電力轉換所需的高溫超導體和功率半導體。諸如砷化鎵 (GaAs) 和碳化矽 (SiC) 之類的材料,都將在未來的電力傳輸技術中扮演重要角色。此外,對太陽能電池而言,材料研究也是提升轉換效率和電力輸出的重要環節。要提升雷射二極體的效率以提高資料傳輸能力,有賴於新型材料和結構的研究。

超靈敏量測對材料特性分析而言十分重要,從量測飛安培級的極漏電流,到量測微歐姆級的電阻以評估高載子移動率材料的電阻率,都是如此。而在相對的領域,最新絕緣體的特性分析則常需使用兆歐姆量測。在接近 0⁰K 的環境下執行的超導體或奈米材料研究,必須降低使用的功率以防止自體加熱,因為這可能會影響到裝置或材料的反應,或使其損壞。在此情況下,必須使用非常低的 DC 電流或電流脈波。

資料庫

Title
Performing Cyclic Voltammetry Measurements Using 2450-EC or 2460-EC Electrochemistry Lab Systems

This application note outlines using either a 2450-EC or 2460-EC Electrochemistry Lab System to perform cyclic voltammetry using the built-in test script and electrochemistry translation cable accessory kit.

Leakage Current and Insulation Resistance Measurements
Characterizing Nanoscale Devices with Differential Conductive Measurements

With appropriate instrumentation, the four-wire source current/measure voltage method is a great improvement over older differential conductance measurements, which are slow, noisy, and complex.  The new technique's single sweep shortens hours of data collection to a few minutes, while improving accuracy.

Hall Effect Measurements Essential for Characterizing High Carrier Mobility
Resistivity Measurements Using the Model 2450 SourceMeter SMU Instrument and a Four-Point Collinear Probe
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS
Making High Resistance Measurements on Small Crystals in Inert Gas or High Vacuum w/ the Model 6517A

The webinar covers semiconductor and other material characterization using Hall…

31:10
標題
Use Hall Effect Measurements for the Characterization of New and Existing Materials
Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization

This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to get the most information about your device.

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