400G 光學與電子 Tx

Tektronix 提供執行符合標準的 Tx 和相干性光學測試所需的支援、專業技術和設備,且 400G 網路技術均可適用。在進行測試與量測的廠商中,唯有 Tektronix 能提供能處理 NRZ、多重調變,以及複雜相干性調變格式的完整 400Gb/s 發射器測試工具。

Tektronix 的 Tx 測試解決方案

即時示波器 DPO70000SX 為一般用途的設計,提供無與倫比的偵錯與分析能力,進而大幅地簡化 400G 測試中發現的複雜測試設定。

  • 適用於 DPO70000SX 的 PAM4 軟體提供功能完整的 400G 量測,其支援新興的 OIF-CEI 和 IEEE 標準。查看產品規格表 »

取樣示波器 DSA8300 動態範圍特別高,特別適用於 PAM4 和 Transmitter Distortion Eye Closure Quaternary (TDECQ) 型量測的詳細特性,可用於 R&D 與製造測試時的電器與光學訊號。

  • DSA8300 的 PAM4 軟體提供完整功能的 400G 量測,其支援新興的 OIF-CEI 和 IEEE 標準。查看產品規格表 »

查看 100G 的 Tektronix 解決方案 »

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100G/400G Datacom Transmitter Measurements: Determining Proper Measurement Tools for 100G/400G Datacom Testing

This application note walks through a number of common misconceptions and key considerations to help you select the proper scope technology (RTO vs. ETO) for your needs.

Overcoming SNDR Measurement Challenges in 100G, 400G Datacom Testing

With important changes occurring in transmitter characterization and measurement methods for 100G and 400G standards (both IEEE and OIF-CEI) it is vital to learn more about SNDR and its advantages, key instrument considerations to account for, and how acquisition bandwidth influences SNDR noise parameters and more.

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Effective Optical Test Strategies for 400G Optical Standards

This webinar discusses how designers and test engineers can determine the most effective optical test strategies for 400G Optical Standards. Learn where PAM-2 and PAM-4 fits, PAM-4 specific Mask Testing- rethinking hit ratios, what is TDEC and how is TDECQ different, and much more.

PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

Electrical Validation of the Type-C Interface

The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery.

Practical 400G PAM4 Test Methods - Optical and Electrical Measurement

The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presentation will review both of these two very different technology fronts and discuss practical elements of physical layer PAM4 testing ranging from 50mm based CEI-XSR specs to 10Km 400GBASE-LR8.

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.



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