100G 光學與電子 Tx/Rx

Tektronix 提供適合 100G 標準的綜合 Tx & Rx 測試支援,還有針對 NRZ 和 PAM4 訊號及相干性同調調變格式的測試導引。Tektronix 測試儀器讓您的團隊做好準備來因應下一波的數據通訊技術。

  • DPO70000SX 系列即時示波器能夠有效率地證明您的技術創新,並快速偵錯和驗證 100G 電子技術標準。業界低雜訊位準和高取樣率,發揮 100G 設計的效能。
  • DSA8300 系列取樣示波器運用領先業界的內建光學參考接收器和超低 OSNR,適合對主要的單模光學標準的光學發射器效能執行精確的特性分析。
  • CR286A 時脈還原儀器支援大多數的 100Gbp/s 標準,並與 Tektronix 取樣示波器和 BERT 共同運作,以提供穩定時脈進行精確的時序量測分析。
  • BERTScope BSA 系列位元誤碼率分析儀能夠產生 PRBS 訊號長碼型與極為精確的 BER 量測結果,並執行深入的根本原因分析。

 

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資料庫

Title
100G/400G Datacom Transmitter Measurements: Determining Proper Measurement Tools for 100G/400G Datacom Testing

This application note walks through a number of common misconceptions and key considerations to help you select the proper scope technology (RTO vs. ETO) for your needs.

消光比 (ER) 校驗白皮書

本白皮書介紹了一些高準確度 ER 量測的好處,不論是在 10 GbE (乙太網路),利用其相對較低的 ER 要求;還是在 SONET/SDH,支援一致、準確的 ER 結果的方法。

100 Gb/s通訊系統實體層測試

本應用指南涵蓋了裝配100G系統必需的發射器和接收器測試。由於每種25+ Gb/s HSS技術均有共同的主題,因此我們將檢視100 GbE 相容性測試要求,同時指出其他高速系統 (如光纖通道的32GFEC) 之間的差異。在100 GbE規格存在空白時,如在25-28 Gb/s介面發訊中,我們將採用光學互通論壇公共電介面實行通訊協定 (OIF-CEI)。

縮小BER和眼狀圖之間的差距 - BER輪廓教程

介紹 BER 輪廓量測

時脈還原入門,第 1 部分

從實用的角度來查看時脈還原,並強調其如何影響量測,第 1 部分。

32 Gbit/s QPSK Transmission at 385 GHzLearn more about a world record breaking wireless system capable of transmitting data at 400 GHz (0.4 THz) using advanced signal coding (up to QAM-16) and key advanced THz devices in this whitepaper.
Semtech Turns to Tektronix DSA8300 Sampling Scope to Characterize New 25-28 Gb/s CDR DevicesThis customer case study illustrates the benefits that Tektronix DataCom test solutions deliver to characterize electrical performance of 100G technologies with the industry’s lowest intrinsic noise floor.
Practices for Measurements on 25 Gb/s Signaling

Review of the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems with oscilloscopes.

使用高效能AWG產生相關光訊號

使用高效能AWG生相關光學訊號」中説明能加快工作速度、確保成功完成任務的解決方案。查看同級產品中最優秀的AWG70000系列可如何簡便地提供您所需的挑戰性訊號、驗證和除錯光學設計。

Ultralow drive voltage silicon traveling-wave modulator Paper (Optical Society of America)

In this paper from the Optical Society of America, the DSA8300 Series Oscilloscope is being used to verify operation of a broadband modulator with a drive voltage of 0.63 Vpp at 20 Gb/s.

This video highlights the benefits of using the DPO70000SX real time oscilloscope…

4:02

Watch our highlights overview of OFC 2017! 

1:42

See a demonstration test system for the next generation of optical signaling,…

5:57

Watch this video to get an overview of the new Link Training Tool, which forms…

1:31

The accelerated development of 400G Ethernet technology is driving new…

1:00:12

In this video we look at a topic that is becoming increasingly important in the…

4:13

At this booth, we're demonstrating our DS8300 Digital Sampling Oscilloscope…

2:09

At this ECOC 2016 Demo Station, we're looking at generating a 50+ Gigabaud…

2:49

Find out how new PAM4 software updates including full noise decomposition enable…

5:15

Tackle today's high-speed serial signals and tomorrow's too with the scalable…

2:04
Title
PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

Electrical Validation of the Type-C Interface

The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery.

Practical 400G PAM4 Test Methods - Optical and Electrical Measurement

The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presentation will review both of these two very different technology fronts and discuss practical elements of physical layer PAM4 testing ranging from 50mm based CEI-XSR specs to 10Km 400GBASE-LR8.

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.

Characterizing Coherent Optical Systems Webinar

Learn about the coherent modulation being considered for 400G networks, the key building blocks of a coherent test system, how to optimize measurement accuracy and the benefits of customizable analysis for non-standard testing.

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